J. R. Matey received a BS in physics from Carnegie-Mellon University in 1973 and MS and Ph.D. in Physics from the University of Illinois, Urbana in 1974 and 1978. He joined the David Sarnoff Research Center in 1977, and was appointed Senior Member of Technical Staff in 1992 and Distinguished Member of Technical Staff in 2006. He retired from Sarnoff in 2008 to take up an appointment as a Research Professor at the US Naval Academy, Annapolis MD. In 2011, Dr. Matey became a Visiting Researcher at the NIST, Gaithersburg and in June 2012 transitioned to a permanent appointment there. Dr. Matey currently enjoys active semi-retirement, dividing time between grand-children and NIST.
Dr. Matey's research interests include instrumentation and measurement science. As a member of NIST's IREX team, his current research centers on evaluation of biometric technologies for government applications. He was the technical lead for the Sarnoff team that developed the Iris on the Move™ systems. He has more than 20 patents and has published more than 80 papers in instrumentation, measurement science, biometrics and industrial processes.
Dr. Matey is a member of Phi Kappa Phi and Sigma Xi. He is a Senior Member of both the IEEE and the ACM and is an IEEE Certified Biometric Professional. His professional society activities include:
Review of Scientific Instruments:
- Editorial Board: 1984-1987, 2002-2004
- Consulting Editor: 2003-2018.
Computers in Physics
- Editor, Laboratory Applications Department: 1993-1998.
Instrumentation and Measurement Science Group of the APS
- Chair: 1989-92
- Secretary-Treasurer: 2014-2017
Princeton Joint Chapter of the IEEE Computer Society and the ACM
- Treasurer: 1982-83
- Chair: 2002 - 2004
- Board Member: 1998- present